Chalcogenides

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Thermal Stability And Percolation Threshold of Ge-Se-Fe Glasses

Journal Title, Volume, Page: 
Materials Letters, Volume:61, Issue:2, January 2007, Pages:432-436
Year of Publication: 
2006
Authors: 
G. Saffarini
Laboratoire PBM, UMR 6522, LECAP, Institut des Matériaux de Rouen, Faculté, des Sciences, Avenue de l'Université BP 12, 76801 Saint Etienne du Rouvray, France
Current Affiliation: 
Department of Physics, Faculty of Sciences, An-Najah National University, Palestine
J.M.Saiter
Laboratoire PBM, UMR 6522, LECAP, Institut des Matériaux de Rouen, Faculté des Sciences, Avenue de l’Université BP 12, 76801 Saint Etienne du Rouvray, France
J.Matthiesen
Anorganische Chemie, Universitat Osnabruck, D-49069, Osnabruck, Germany
Preferred Abstract (Original): 
The characteristic temperatures such as the glass transition temperature (Tg), the onset temperature of crystallization (Tc) and the melting temperatures, (Tm) have been determined for glasses belonging to the GexSe100 − x − yFey (y = 2, 4 and 6 at.%). Differential scanning calorimetry and differential thermal analysis measurements have been used for their determination. These temperatures have been used to evaluate the thermal stability of the investigated glassy alloys using Dietzel (ΔT) and Hruby (Hr) criteria. The variations of ΔT and Hr with the average coordination number, n, have been specified. It is found that both ΔT and Hr exhibit a maximum at n = 2.4. This observation is a realization of Phillips'–Thorpe threshold where the maximum stability of the network is just obtained if the percolation threshold limit is reached. The overall mean bond energies of the studied compositions have also been calculated and their correlation with the glass transition temperature is discussed.
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Compactness In Relation To The Mean Coordination Number In Glassy GexBi6s94-X

Journal Title, Volume, Page: 
Chalcogenide Letters Vol. 3, No. 6, June 2006, p. 49 - 53
Year of Publication: 
2006
Authors: 
G. Saffarini
Laboratoire PBM, UMR 6522, LECAP, Institut des Matériaux de Rouen, Faculté des Sciences, Avenue de l’Université BP 12, 76801 Saint Etienne du Rouvray, France
Current Affiliation: 
Department of Physics, Faculty of Sciences, An-Najah National University, Palestine
J. M. Saiter
Laboratoire PBM, UMR 6522, LECAP, Institut des Matériaux de Rouen, Faculté des Sciences, Avenue de l’Université BP 12, 76801 Saint Etienne du Rouvray, France
Preferred Abstract (Original): 

The compactness of the structure of glassyGexBi6S94-x (14 ≤ x ≤ 26 at %) is determined from the measured densities. The peculiarities observed in the compactness-composition dependence are understood using Phillips’-Thorpe and Tanaka’s topological models proposed for the structure of these covalently bonded solids.

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The Composition Dependence of The Optical Band Gap In Ge-Se-In Thin Films

Journal Title, Volume, Page: 
Optical Materials, Volume 29, Issue 9, May 2007, Pages 1143-1147
Year of Publication: 
2007
Authors: 
G. Saffarini
LECAP, PBM, UMR6522, Institut des Matériaux de Rouen, Université de Rouen, BP 12, 76801 Saint Etienne du Rouvray Cedex, France
Current Affiliation: 
Department of Physics, Faculty of Sciences, An-Najah National University, Palestine
J.M. Saiter
LECAP, PBM, UMR6522, Institut des Mate´riaux de Rouen, Universite´ de Rouen, BP 12, 76801 Saint Etienne du Rouvray Cedex, France
H. Schmitt
Technische Physik, Universitat des Saarlandes, 66123 Saarbrucken, Germany
Preferred Abstract (Original): 

Bulk glasses with the chemical composition Gey Se94−yIn6 (8 ⩽ y ⩽ 30 at%) have been prepared from high purity constituent elements. Fragments of the bulk glasses are used to deposit thin films by vacuum thermal evaporation. The optical band gaps (Eg s) of the as-deposited films have been measured. The allowed optical transition is found to be indirect. The relation of Eg to the covalent coordination number, Z, is demonstrated by varying the composition parameter y of the thin films. A maximum in the compositional dependence of Eg is attained at Z = 2.63. The cohesive energies (CE) of the investigated samples have also been calculated using the method suggested by the chemical bond approach. It is found that the composition dependence of the CE also possesses a peak at Z = 2.63.A plausible explanation based on the bonding considerations between the constituents has been provided for the understanding of the Eg-Z and CE-Z dependences for these Ge–Se–In thin films.
PACS 61.43.Dq;78.66.Jg

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