Extended X-ray absorption fine structure (EXAFS)

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Local Environment of Indium in ‎Ge23.33Se64.67In12 Chalcogenide Glass

Journal Title, Volume, Page: 
Materials Letters Volume 35, Issues 5–6 , Pages 309–313
Year of Publication: 
1998
Authors: 
G. Saffarini
Physics Department, An-Najah National University, Nablus, Palestine
Current Affiliation: 
Department of Physics, Faculty of Science, An-Najah National University, Palestine
J.M. Saiter
Laboratoire d'Etude et de Caracterisation des Amorphes et des Polymères, Faculté des Sciences, Université de Rouen, 76821 Mont Saint Aignan CEDEX, France
J. Ledru
Laboratoire d'Etude et de Caracterisation des Amorphes et des Polymères, Faculté des Sciences, Université de Rouen, 76821 Mont Saint Aignan CEDEX, France
S. Benazeth
LURE, Bâtiment 209d, Université de Paris-Sud, 91405 Orsay Cedex, France
Preferred Abstract (Original): 

EXAFS measurements, from the In K edge, on Ge23.33Se64.67In12 glass, have been performed. For this glass, it is found that In is only coordinated with Se atoms. By complementing the EXAFS results obtained from the fitting procedure followed in this work with the earlier reported DSC results obtained on this system, it is concluded that in this glass, the coordination number of In is equal to three. Moreover, this approach of coupling EXAFS with DSC results allows one to calibrate the Γ factor for systems which lack a reference material, or systems for which an ab initio calculation cannot be performed, as in our case.

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