X-Ray Photoelectron Spectroscopic Measurements on Glassy Ge20S80−Xbix (X=0,16)

Journal Title, Volume, Page:

Materials Letters, Volume 46, Issue 6, December 2000, Pages 327-331

Year of Publication:

2000

Link:

http://www.sciencedirect.com/science/article/pii/S0167577X00001968

Authors:

G. Saffarini

Department of Physics, Faculty of Sciences, An-Najah National University, Palestine

Current Affiliation:

Department of Physics, Faculty of Sciences, An-Najah National University, Palestine

[email protected]

J. M. Saiter

Laboratoire d'Etude et de Caracterisation des Amorphes et des Polymeres, Faculte des Science, Universite de Rouen, 76821 Mont Saint Aignan Cedex, France

Preferred Abstract (Original):

X-ray photoelectron spectroscopy measurements have been performed on n-type Bi-modified Ge₂₀S₆₄Bi₁₆ glass. The observed chemical shifts show that Bi is incorporated as a positive charged center into the matrix of Ge₂₀S₈₀ parent glass.

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X-Ray Photoelectron Spectroscopic Measurements on Glassy Ge20S80−Xbix (X=0,16)