Extended X-Ray Absorption Fine Structure Study on Bi Modified Ges Bulk Glasses

Journal Title, Volume, Page:

Journal of Optoelectronics and Advanced Materials Vol. 3, No. 2, June 2001, p. 485 - 490

Year of Publication:

2001

Link:

http://joam.inoe.ro/arhiva/vol3nr2.html

Authors:

G. Saffarini

Department of Physics, Faculty of Sciences, An-Najah National University, Palestine

Current Affiliation:

Department of Physics, Faculty of Sciences, An-Najah National University, Palestine

[email protected]

J. M. Saitera

Laboratoire d’Etude et de Caractérisation des Amorphes et des polymères, Faculté des Sciences, Université de Rouen, 76821 Mont Saint Aignan CEDEX, France

A. Zumailana

Department of Physic, Faculty of Sciences and Education, University of Aden, Republic of Yemen

Preferred Abstract (Original):

EXAFS measurements have been performed from the Ge K edge and Bi LIII edge on GeSBi glasses with 6, 8 and 16 Bi at. %, and on crystalline Bi2S3. As expected, Ge is found to be fourfold coordinated with S atoms. It is also found that Bi is only coordinated with S with a coordination number CN = 4. This result for the CN of Bi contradicts the conclusion of Elliot and Steel. On the basis of the obtained CN of Bi, it is possible to exclude the presence of Bi2S3 microcrystalline inclusions and to assert that these glasses are homogeneous at the microscopic level.

Attachment	Size
Extended_X-Ray_Absorption_Fine_Structure_Study_on_Bi_Modified_Ges_Bulk_Glasses.pdf	145.95 KB

An-Najah Staff

Author Information

Extended X-Ray Absorption Fine Structure Study on Bi Modified Ges Bulk Glasses