An EXAFS Investigation of the Local Order Around ‎Indium in Ge–Se–In Glasses

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Journal Title, Volume, Page: 
Journal of Non-Crystalline Solids Volumes 232–234, Pages 634–637
Year of Publication: 
1998
Authors: 
G. Saffarini
Physics Department, An-Najah National University, Nablus, Palestine
Current Affiliation: 
Department of Physics, Faculty of Science, An-Najah National University, Palestine
J Ledru
Laboratoire d'Etude et de Caractérisation des Amorphes et des Polymères, Faculté des Sciences, Université de Rouen, 76821 Mont Saint Aignan cedex, France
J.M Saiter
Laboratoire d'Etude et de Caractérisation des Amorphes et des Polymères, Faculté des Sciences, Université de Rouen, 76821 Mont Saint Aignan cedex, France
S Benazeth
LURE, Bâtiment 209D, Université de Paris-Sud, 91405 Orsay cedex, France
Preferred Abstract (Original): 

EXAFS measurements were performed, at the In K edge, on devitrified Ge5Se80In15 and on a series of vitreous Ge–Se–In alloys. The results indicate that the In atoms have essentially the same local surroundings in all of the samples investigated. We found that an In atom is surrounded by three Se atoms at a distance of about 0.259 nm and forms In2Se3 microclusters.