Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy

Hamdallah Bearat's picture
Journal Title, Volume, Page: 
Application Note # 5991-0791EN, Agilent Technologies, Inc., 2012, 8p.
Year of Publication: 
2012
Authors: 
Hamdallah A. Béarat
Current Affiliation: 
Department of Materials Science, Faculty of Engineering and Information Technology, An-Najah National University, Nablus. Palestine
Preferred Abstract (Original): 
Scanning electron microscopy has become a popular imaging tool in different areas of science and engineering [1–7]. Being able to elucidate the structure of a material at the micro-and/or the nano-scale level is indeed crucial to characterizing the material, understanding its mechanism and mode of formation, and explaining/predicting its properties and performance under a given set of environmental or load conditions [1, 2, 3, 8,9]. Secondary electron imaging is commonly used to reveal surface topography, grain ...

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