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IEEE International Test Conference (ITC)

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Mon, 2014-05-05 13:36 — Falah Mohammed
Research Title: 
RADPro: Automatic RF Analyzer and Diagnostic Program Generation Tool
Authors: 
Falah Mohammed
Authors: 
Sukeshwar Kannan
Authors: 
Bruce Kim
Authors: 
Ganesh Srinivasan
Authors: 
Friedrich Taenzlar
Authors: 
Richard Antley
Authors: 
Craig Force
Country: 
USA
Date: 
Tue, 2010-11-02
Research Abstract: 

This paper provides development of an RF circuit software tool that generates diagnostic programs automatically for device interface boards. The diagnostic tool utilizes novel techniques to differentiate faulty RF circuits embedded in printed circuit boards. The diagnostic tool provides user-transparent pseudocodes with high fault coverage and significantly decreases time to market.