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Electronic Components and Technology Conference (ECTC)

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Mon, 2014-05-05 13:38 — Falah Mohammed
Research Title: 
Analysis of Carbon Nanotube Based Through Silicon Vias
Authors: 
Falah Mohammed
Authors: 
Sukeshwar Kannan
Authors: 
Byoungchul Ahn
Authors: 
Anurag Gupta
Authors: 
Bruce C. Kim
Country: 
USA
Date: 
Tue, 2010-06-01
Research Abstract: 

In this paper we have provided analysis of carbon nanotube (CNT) based Through Silicon Vias (TSVs) for package interconnects. The package interconnects are fundamental bottlenecks to achieving high performance and reliability. We have provided electrical modeling and performed simulations on TSV with copper and carbon nanotubes. The results from the CNT-based TSVs were greatly superior to conventional vias with copper.