International Conference on Computer Science and Software Engineering

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Research Title: 
Effective Pattern Representation for Safety Critical Embedded Systems
Authors: 
Ashraf Armoush
Authors: 
F. Salewski
Authors: 
S. Kowalewski
Country: 
Hubei
Date: 
Fri, 2008-12-12
Research Abstract: 

Design Patterns, which give abstract solutions to commonly recurring design problems, have been widely used in the software and hardware domain. This paper focuses on nonfunctional implications and side effects of the design patterns on safety critical applications, which are especially critical in embedded systems. We propose a pattern representation for safety critical embedded application design methods by including fields for the implications and side effects of the represented design pattern on the nonfunctional requirements of the safety critical applications. These requirements include safety, reliability, modifiability, cost, and execution time.