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The Atomic Microscope can be used for Measuring the Potential Drop Across A PN- Junction with ‎Submicrometer Precision ‎

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Mon, 2014-03-03 09:55 — Zeid Naim Qamhieh
Year of Publication: 
1994
Authors: 
Zeid Qamhieh
Current Affiliation: 
Department of Physics, Faculty of Science, An-Najah National University, Palestine
[email protected]
Preferred Abstract (Original):